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X-Ray Powder Diffractometer (XRD)


X-ray diffraction is a versatile and non-destructive analysis method for the determination of material properties such as phase composition, structure and texture of powders, solids and liquids. Depending on the composition, X-ray radiation will be diffracted in a specific way in samples due to the regular distribution of atoms in a crystal. The diffraction pattern provides information about among others phase, crystal structure and crystal size.

Technical Details

Brand Bruker
Goniometer D8 ADVANCE Theta/Theta
Measurement circle 560mm
Tube 2.2 kW Cu long fine focus
Tube Power 40 kV / 40 mA
Primary optics Motorized divergence slits
Soller slits
Gobel Mirror
Sample stage Standard rotation stage with Motorized Air-Scatter Knife
Anton Paar TTK600 temperature chamber UMC- stage
Capillary stage; standard goniometer head
Secondary optics Soller slits
Detector LYNXEYE_XE_T, 3°opening


  • Identification of the crystal (by comparison with data from a database).
  • Identification and characterisation of solid crystalline materials (including multi-phase mixtures).
  • Determination of purity of crystals.
  • Small Angle X-ray Scattering (SAXS): determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered material.
  • Wide Angle X-ray Diffraction (WAXD: the determination of the crystallinity of polymers such as polyesters, polyamides, and in cellulose and starch.
  • Wide Angle X-ray Diffraction (WAXD): the determination of the size and phase of metal nanoparticles as well as the support materials in heterogeneous catalysts
  • X-Ray Reflectometry (XRR): determination of layer thickness (0.1 nm-1000nm)
  • Measuring XRD patterns at different temperatures
  • Measuring XRD patterns in transmission mode with capillary sample holder.

Last edited by Daniella Stijnen on 2021-01-15